SN74ACT573PWLE Samanlaisia

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- SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
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- OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
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- DUAL 5-INPUT POSITIVE-NOR GATES
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- 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
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- HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
SN74AHC74PWLE
- DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
SN74HC02DBR
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74ACT573PWLE Datasheet ja Spec

Valmistaja : TI

Pakkauspäivämäärä : PW

Pins : 20

Lämpötila : Min -40 °C | Max 85 °C

Koko : 92 KB

Hakemus : OCTAL D-TYPE TRANSPARENT LATCHES WITH 3-STATE OUTPUTS